6½-Digit-High Precision Supply Source Measure Unit All-in-One Machine ANSMU200-3(F)

Four-quadrant full-scale operation.

Wide source and measurement range: Voltage ±210V, Current ±3.15A.

Low-noise linear power supply technology with output noise < 3mVrms.

Voltage, current, resistance, and power measurements can be performed in both CV and CC modes.

Supports both front and rear panel output and measurement, and supports 2-wire and 4-wire measurement methods.

A built-in high-precision integrating ADC for precision measurement, and a dual-channel high-speed digital ADC to meet high-speed sampling test requirements.

6½-digit measurement display with minimum voltage/current resolution down to 10nV/10fA.

High measurement accuracy: Up to 0.002% at the optimum point.

Voltage measurement input impedance > 10GΩ.

5-inch color touchscreen for easy operation and intuitive display.

Data statistics interface with line chart and table views.

Voltage limit, current limit, and overtemperature protection functions.

Rich waveform editing functions supporting sweep, pulse, flowchart, and script modes.

Multiple communication interfaces: serial port, LAN port, GPIB, and user-configurable digital I/O.

Multi-unit synchronous testing via A-LINK with multiple supply-measure units.

Support triaxial shielded cable connection for effective noise reduction and high-precision measurement.

Testing of discrete devices and passive components, such as diodes, BJTs, FETs, resistors, etc.

Testing of semiconductor structures such as wafers and thin films.

Testing of new materials such as graphene and nanomaterials.

Testing of optoelectronic devices such as LEDs, AMOLEDs, photovoltaics, and solar cells.

Testing of electrochemical applications such as cyclic voltammetry, battery charge/discharge cycles, and electrodeposition.

Material characterization including resistivity, Hall effect, and high-ohmic resistance testing.